Issue No. 25/December 7, 2007
ALERT:An Error in the Tables in the Article "Yield Data from the University of Illinois Standard Corn Rootworm Product Efficacy Trials"
An error in three tables regarding rate of application has been corrected.
Last Issue in 2007
Thank you to the readers of the Bulletin for their interest, reports, and feedback.
The Crop Protection Technology Conference and Corn and Soybean Classics Are Right Around the Corner
Save money by preregistering for the Crop Protection Technology Conference (January 9-10) and the Corn and Soybean Classics (January 14-18).
2008 Crop Management Conferences to Address Critical Issues
Three regional Illinois crop management conferences in late January and mid-February will offer both general-interest and specialized sessions.
Yield Data from the University of Illinois Standard Corn Rootworm Product Efficacy Trials
Research findings have raised significant questions about the utility of root ratings as the sole determinant of rootworm larval injury and their relationship to yield.
Follow-Up on Our Annual Survey for Second-Generation European Corn Borers
There is mounting evidence to indicate that the widespread planting of Bt corn has reduced the average population of European corn borers over time.
A report is provided this issue for southern Illinois.