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Issue No. 23, Article 1/October 8, 2004

Mark Your Calendars for the 2005 Crop Protection Technology Conference

The 57th annual meeting of the Illinois Crop Protection Technology Conference will take place on January 5 and 6, 2005, at the Illini Union on the campus of the University of Illinois. This year's conference will begin with a keynote session on climatological changes and their effects on crop production and crop protection practices. Many of these changes include the more familiar trends we've all observed with respect to earlier planting and harvest dates. In addition, it seems that we experience, in the United States and elsewhere around the globe, weather events such as droughts, floods, tornadoes, and hurricanes that are more frequently extreme than in previous decades. Do scientific data support these perceptions? Are climatological changes real and more extreme? If so, are they part of the natural and cyclical changes that have occurred for eons?

In addition to the keynote session, the conference will offer six symposia and 15 specialized seminars that participants can choose from. In essence, each participant at the 2005 conference can tailor his or her own program and seek CCA credits of the most personal importance. Speakers at the symposia will address the following topics: (1) soybean rust, (2) management of natural resources and related regulatory issues, (3) corn rootworm management challenges, (4) disease management with foliar applications, (5) emerging crop protection issues, and (6) transgenic management of field crop pests. Each symposium will feature three or four speakers and last 1-1/2 hours. The specialized seminars, which also will last 1-1/2 hours, are designed to be more interactive. Topics cover a broad range of subjects, including (1) ground versus aerial application methodologies, (2) emerging corn nematode issues, (3) forage management, (4) soybean aphids, (5) integrating electronic technologies with IPM, (6) designing on-farm research protocols, (7) soil testing and quality control, (8) wheat management, (9) fungicide modes of action, (10) troubleshooting difficult field crop pest problems, (11) sampling protocols for soybean rust, (12) management of secondary soil insects, (13) aquatic weed management, (14) water-quality (herbicide/nitrogen) related issues, and (15) pesticide drift and sensitivity of different plant species. Specialized seminars and symposia will each be offered twice.

If you have any questions about the content of the 2005 program, please contact Mike Gray (megray@uiuc.edu) and/or Suzanne Bissonnette (sbisson@uiuc.edu). Questions also may be directed to Sandy Osterbur (saosterb@uiuc.edu, 217-244-2124), conference coordinator. The registration fee prior to December 17 is $110. After that date, the fee will increase to $140. Please consult the following Web site for registration information. --Mike Gray

Mike Gray

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